Epitaxial orientation of MBE grown Ru2Si3 films on Si(111) and Si(001)

Thin Solid Films

Volumn 368, Issue 1, 2000, Pages 15-21

  Lenssen, D ^a   Guggi, D ^a   Bay, H L ^a   Mantl, S ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

FILM GROWTH; MOLECULAR BEAM EPITAXY; SEMICONDUCTING SILICON; THIN FILMS; X RAY DIFFRACTION;

FILM ORIENTATION;

RUTHENIUM COMPOUNDS;

EID: 0033750447     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(00)00737-9     Document Type: Article

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7. D. Lenssen, S. Lenk, H.L. Bay, S. Mantl, Thin Solid Films, submitted for publication.
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9. Lange H. Phys. Status Solidi B. 201:1997;3.