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Volumn 284, Issue 1-2, 1999, Pages 198-205

The Ruthenium-Silicon system

Author keywords

alloys; Differential thermal analysis (DTA); Microprobe analysis (EPMA); Ruthenium Silicon phase diagram; X ray diffraction (XRD)

Indexed keywords

BINARY ALLOYS; CRYSTAL ATOMIC STRUCTURE; DIFFERENTIAL THERMAL ANALYSIS; MICROANALYSIS; PHASE DIAGRAMS; X RAY CRYSTALLOGRAPHY;

EID: 0033522111     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-8388(98)00911-6     Document Type: Article
Times cited : (32)

References (31)
  • 17
    • 0026242171 scopus 로고
    • A.T. Dinsdale, CALPHAD, 15(4) (1991) 319-425.
    • (1991) CALPHAD , vol.15 , Issue.4 , pp. 319-425
    • Dinsdale, A.T.1
  • 28
    • 9344234768 scopus 로고    scopus 로고
    • Thesis, Universities of Lausanne (CH) and Nancy (F), December
    • L. Perring, Thesis, Universities of Lausanne (CH) and Nancy (F), December 1997.
    • (1997)
    • Perring, L.1
  • 31
    • 9344250305 scopus 로고    scopus 로고
    • L. Perring, F. Bussy, J.J. Kuntz, J.C. Gachon, accepted by Berichte der Bunsen-Gesellschaft RuSi
    • L. Perring, F. Bussy, J.J. Kuntz, J.C. Gachon, accepted by Berichte der Bunsen-Gesellschaft RuSi.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.