|
Volumn 284, Issue 1-2, 1999, Pages 198-205
|
The Ruthenium-Silicon system
|
Author keywords
|
Indexed keywords
BINARY ALLOYS;
CRYSTAL ATOMIC STRUCTURE;
DIFFERENTIAL THERMAL ANALYSIS;
MICROANALYSIS;
PHASE DIAGRAMS;
X RAY CRYSTALLOGRAPHY;
ELECTRON PROBE MICROANALYSIS (EPMA);
RUTHENIUM ALLOYS;
|
EID: 0033522111
PISSN: 09258388
EISSN: None
Source Type: Journal
DOI: 10.1016/S0925-8388(98)00911-6 Document Type: Article |
Times cited : (32)
|
References (31)
|