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Diamond and Related Materials

Volumn 9, Issue 3, 2000, Pages 413-416

Capacitance-voltage profiling of deuterium passivation and diffusion in diamond Schottky diodes

(3) Zeisel, R a Nebel, C E a Stutzmann, M a

a WALTER SCHOTTKY INSTITUT (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; BORON; CAPACITANCE MEASUREMENT; DEUTERIUM; DIFFUSION IN SOLIDS; ELECTRIC CHARGE; ELECTRON ENERGY LEVELS; HYDROGEN; PASSIVATION; SEMICONDUCTING DIAMONDS; SEMICONDUCTOR DOPING; VOLTAGE MEASUREMENT;

DIAMOND SCHOTTKY DIODES;

SEMICONDUCTOR DIODES;

EID: 0033748134 PISSN: 09259635 EISSN: None Source Type: Journal
DOI: 10.1016/S0925-9635(99)00260-5 Document Type: Article

Times cited : (16)

References (10)

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