Microstructural characterization of diamond films deposited on c-BN crystals

Diamond and Related Materials

Volumn 9, Issue 3, 2000, Pages 269-273

  Nistor, L ^a,b   Buschmann, V ^c   Ralchenko, V ^d   Dinca, G ^e   Vlasov, I ^d   Van Landuyt, J ^b   Fuess, H ^c  

^a NATIONAL INSTITUTE OF MATERIALS PHYSICS   (Romania)

^b UNIVERSITY OF ANTWERP   (Belgium)

^c DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

^d PROKHOROV GENERAL PHYSICS INSTITUTE   (Russian Federation)

^e Dacia Synthetic Diamond   (Romania)

Author keywords

[No Author keywords available]

Indexed keywords

COALESCENCE; CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; CRYSTAL STRUCTURE; CUBIC BORON NITRIDE; EPITAXIAL GROWTH; MICROWAVES; MORPHOLOGY; NUCLEATION; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; SURFACE ROUGHNESS; TWINNING;

PSEUDO FIVE-FOLD SYMMETRY;

DIAMOND FILMS;

EID: 0033747763     PISSN: 09259635     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-9635(99)00246-0     Document Type: Article

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