Copper implantation defects in MgO observed by positron beam analysis, RBS and X-TEM

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 166, Issue , 2000, Pages 225-231

  Van Huis, M A ^a   Fedorov, A V ^a   Van Veen, A ^a   Smulders, P J M ^b   Kooi, B J ^b   De Hosson, J Th M ^b  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b UNIVERSITY OF GRONINGEN   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; COPPER; CRYSTAL DEFECTS; CRYSTAL LATTICES; DIFFUSION IN SOLIDS; EPITAXIAL GROWTH; ION IMPLANTATION; NANOSTRUCTURED MATERIALS; POSITRONS; PRECIPITATION (CHEMICAL); RUTHERFORD BACKSCATTERING SPECTROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

NANOCAVITIES; NANOPRECIPITATES; POSITRON BEAM ANALYSIS (PBA);

MAGNESIA;

EID: 0033747752     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(99)00658-8     Document Type: Article

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