Microelectrical characterization of diamond films: An attempt to understand the structural influence on electrical transport phenomena

Diamond and Related Materials

Volumn 9, Issue 3, 2000, Pages 1061-1065

  Pereira, L ^a   Pereira, E ^a   Gomes, H ^b   Rodrigues, A ^b   Rees, A ^c   Cremades, A ^d   Piqueras, J ^d  

^a UNIVERSITY OF AVEIRO   (Portugal)

^b UNIVERSITY OF ALGARVE   (Portugal)

^c BANGOR UNIVERSITY   (United Kingdom)

^d UNIVERSIDAD COMPLUTENSE DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; BAND STRUCTURE; CATHODOLUMINESCENCE; CRYSTAL DEFECTS; ELECTRIC CONDUCTIVITY OF SOLIDS; METALLOGRAPHIC MICROSTRUCTURE; MORPHOLOGY; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; RAMAN SPECTROSCOPY; TRANSPORT PROPERTIES;

MICRO-RAMAN ANALYSIS; MICROELECTRICAL CONDUCTION; MICROWAVE PLASMA ASSISTED CHEMICAL VAPOR DEPOSITION;

DIAMOND FILMS;

EID: 0033746892     PISSN: 09259635     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-9635(99)00330-1     Document Type: Article

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