Influence of reactive SFx gases on electrode surfaces after electrical discharges under SF6 atmosphere

IEEE Transactions on Dielectrics and Electrical Insulation

Volumn 7, Issue 2, 2000, Pages 234-240

  Beyer, C ^a   Jenett, H ^a   Klockow, D ^a  

^a LEIBNIZ INSTITUT FÜR ANALYTISCHE WISSENSCHAFTEN ISAS E V   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRODES; ENERGY DISPERSIVE SPECTROSCOPY; FOURIER TRANSFORM INFRARED SPECTROSCOPY; MASS SPECTROMETRY; PARTIAL DISCHARGES; SCANNING ELECTRON MICROSCOPY; SULFUR COMPOUNDS; SURFACES; X RAY PHOTOELECTRON SPECTROSCOPY;

CORROSIVE BYPRODUCTS; DEPTH PROFILE ANALYSIS; GAS INSULATED SYSTEM ELECTRODES; HIGH FREQUENCY PLASMA; SECONDARY NEUTRAL MASS SPECTROMETRY;

ELECTRIC SPARKS;

EID: 0033742875     PISSN: 10709878     EISSN: None     Source Type: Journal    
DOI: 10.1109/94.841815     Document Type: Article

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