Low-temperature scanning force microscope for investigating buried two-dimensional electron systems under quantum Hall conditions

Applied Surface Science

Volumn 157, Issue 4, 2000, Pages 349-354

  Weitz, P ^a   Ahlswede, E ^a   Weis, J ^a   Klitzing, K V ^a   Eberl, K ^a  

^a MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROSTATICS; HALL EFFECT; HETEROJUNCTIONS; SCANNING; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING GALLIUM ARSENIDE;

KELVIN PROBE FORCE MICROSCOPY; LOW TEMPERATURE SCANNING FORCE MICROSCOPY; QUANTUM HALL EFFECT; TWO-DIMENSIONAL ELECTRON SYSTEMS;

ATOMIC FORCE MICROSCOPY;

EID: 0033742839     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(99)00550-4     Document Type: Article

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