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Volumn 33, Issue 10, 2000, Pages 1230-1238
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Numerical simulation of Bragg-case section topographic images of dislocations in silicon
a b c |
Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER SIMULATION;
DISLOCATIONS (CRYSTALS);
ELECTROMAGNETIC WAVE DIFFRACTION;
IMAGING TECHNIQUES;
LIGHT INTERFERENCE;
LIGHT REFLECTION;
SUBSTRATES;
SYNCHROTRON RADIATION;
BRAGG CASE SECTION PATTERNS;
INTERFERENCE FRINGES;
SILICON WAFERS;
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EID: 0033740945
PISSN: 00223727
EISSN: None
Source Type: Journal
DOI: 10.1088/0022-3727/33/10/314 Document Type: Article |
Times cited : (7)
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References (19)
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