Defect and disorder reduction by annealing in hydrogenated tetrahedral amorphous carbon

Diamond and Related Materials

Volumn 9, Issue 3, 2000, Pages 765-770

  Conway, N M J ^a,d   Ferrari, A C ^a   Flewitt, A J ^a   Robertson, J ^a   Milne, W I ^a   Tagliaferro, A ^b   Beyer, W ^c  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b POLITECNICO DI TORINO   (Italy)

^c FORSCHUNGSZENTRUM JÜLICH   (Germany)

^d LABORATOIRE DE PHYSIQUE DES INTERFACES ET DES COUCHES MINCES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; DEFECTS; FILM GROWTH; HYDROGENATION; PLASMA SOURCES; RAMAN SPECTROSCOPY; REDUCTION; SCANNING TUNNELING MICROSCOPY;

EFFUSION; HYDROGENATED TETRAHEDRAL AMORPHOUS CARBONS;

AMORPHOUS FILMS;

EID: 0033737976     PISSN: 09259635     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-9635(99)00271-X     Document Type: Article

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