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Volumn 21, Issue 6, 2000, Pages 286-288

Fully planarized 4H-SiC trench MOS barrier Schottky (TMBS) rectifier

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT DENSITY; CURRENT VOLTAGE CHARACTERISTICS; LEAKAGE CURRENTS; MOS DEVICES; SCHOTTKY BARRIER DIODES; SEMICONDUCTING SILICON COMPOUNDS; SILICON CARBIDE;

EID: 0033737765     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/55.843152     Document Type: Article
Times cited : (46)

References (8)
  • 2
    • 0000633737 scopus 로고    scopus 로고
    • A 3 kV Schottky barrier diode in 4H-SiC
    • Q. Wahab et al., "A 3 kV Schottky barrier diode in 4H-SiC," Appl. Phys. Lett., vol. 72, pp. 445-447, 1998.
    • (1998) Appl. Phys. Lett. , vol.72 , pp. 445-447
    • Wahab, Q.1
  • 3
    • 0032315813 scopus 로고    scopus 로고
    • 4H-SiC bipolar P-i-N diodes with 5.5 kV blocking voltages
    • Charlottesville, VA
    • R. Singh et al., "4H-SiC bipolar P-i-N diodes with 5.5 kV blocking voltages," in 56th Annu. Device Research Conf. Dig., Charlottesville, VA, 1998.
    • (1998) 56th Annu. Device Research Conf. Dig.
    • Singh, R.1
  • 5
    • 0032046055 scopus 로고    scopus 로고
    • A dual-metal-trench (DMT) Schottky pinch-rectifier in 4H-SiC
    • K. J. Schoen et al., "A dual-metal-trench (DMT) Schottky pinch-rectifier in 4H-SiC," IEEE Electron Device Lett., vol. 19, pp. 97-99, 1998.
    • (1998) IEEE Electron Device Lett. , vol.19 , pp. 97-99
    • Schoen, K.J.1
  • 6
    • 0011723639 scopus 로고
    • Trench MOS Barrier Schottky (TMBS) rectifier
    • M. Mehrotra and B. J. Baliga, "Trench MOS Barrier Schottky (TMBS) rectifier," Solid-State Electron., vol. 38, pp. 703-713, 1995.
    • (1995) Solid-State Electron. , vol.38 , pp. 703-713
    • Mehrotra, M.1    Baliga, B.J.2
  • 7
    • 0032182966 scopus 로고    scopus 로고
    • Effect of reactive ion etch-induced damage on the peformance of 4H-SiC Schottky barrier diodes
    • V. Khemka, T. P. Chow, and R. J. Gutmann, "Effect of reactive ion etch-induced damage on the peformance of 4H-SiC Schottky barrier diodes," J. Electron. Mater., vol. 27, pp. 1128-1135, 1998.
    • (1998) J. Electron. Mater. , vol.27 , pp. 1128-1135
    • Khemka, V.1    Chow, T.P.2    Gutmann, R.J.3
  • 8
    • 0032598932 scopus 로고    scopus 로고
    • Static and dynamic characteristics of 1100 V, double-implanted, planar 4H-SiC PIN rectifier
    • Toronto, Ont., Canada
    • V. Khemka et al., "Static and dynamic characteristics of 1100 V, double-implanted, planar 4H-SiC PIN rectifier," in Proc. Int. Symp. Power Semiconductor Devices and ICs, Toronto, Ont., Canada, 1999.
    • (1999) Proc. Int. Symp. Power Semiconductor Devices and ICs
    • Khemka, V.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.