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Volumn 168, Issue 1, 2000, Pages 65-71

Zinc and group V element co-implantation in indium phosphide

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CARRIER CONCENTRATION; COMPOSITION EFFECTS; CRYSTAL IMPURITIES; DIFFUSION; ELECTRIC POTENTIAL; ION IMPLANTATION; SEMICONDUCTING ZINC COMPOUNDS; SEMICONDUCTOR DOPING;

EID: 0033737677     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(99)00806-X     Document Type: Article
Times cited : (7)

References (31)
  • 28
    • 0042181124 scopus 로고    scopus 로고
    • Implant Sciences Corp. 107 Audubon Rd., #5, Wakefield, MA 01880
    • PROFILE, Ion Beam Profile Code version 3.20, Implant Sciences Corp. 107 Audubon Rd., #5, Wakefield, MA 01880.
    • PROFILE, Ion Beam Profile Code Version 3.20


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.