Resonance fluorescence studies of spectroscopically pure SiO2

Journal of the Indian Chemical Society

Volumn 77, Issue 9, 2000, Pages 445-446

  Bayrakceken, Fuat ^a   Yaman, Ali ^b   Jomehri, Behzad B ^b  

^a YEDITEPE UNIVERSITY   (Turkey)

^b ANKARA UNIVERSITY   (Turkey)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON DIOXIDE;

ABSORPTION; ARTICLE; CHEMICAL ANALYSIS; OPTICS; PHOTOLYSIS; SPECTROFLUOROMETRY; SPECTROSCOPY; STRUCTURE ANALYSIS; TEMPERATURE; ULTRAVIOLET RADIATION;

EID: 0033735588     PISSN: 00194522     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (9)

1. C. V. Raman and K. S. Krishnan, Nature, 1928, 121, 501.
2. C. V. Raman and K. S. Krishnan, Proc. R. Soc. London, 1929, 122, 123.
3. L. Brillouin, Ann. Phys., 1922, 88, 17.
4. G. Landsberg and H. Mandelstam, Naturwissenchaften, 1928, 16, 557.
5. A. V. Akimov, A. A. Kaplyanskii and E. S. Moskalenko, J. Lumin., 1990, 45, 135.
6. S. Hayashi and K. Yamamoto, J. Lumin., 1996, 70, 352.
7. K. Fukui, H. Miyauchi and Y. Iwasawa, Chem. Phys. Lett., 1997, 274, 133.
8. Private communications with Prof. J. R. Lombardi of City University of New York, U.S.A.
9. K. Su, T. D. Tilley and M. J. Sailor, J. Am. Chem. Soc., 1996, 118, 3459.