Phase-sensitive surface X-ray scattering study of a crystalline organic-organic heterostructure

Physica B: Condensed Matter

Volumn 283, Issue 1-3, 2000, Pages 75-78

  Schreiber, F ^a,b   Gerstenberg, M C ^c   Edinger, B ^a,b   Toperverg, B ^a,b   Forrest, S R ^c   Scoles, G ^c   Dosch, H ^a,b  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

^b UNIVERSITY OF STUTTGART   (Germany)

^c Princeton University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; CRYSTALLINE MATERIALS; MOLECULAR STRUCTURE; MONOLAYERS; PLASTIC FILMS; SEMICONDUCTING FILMS; SEMICONDUCTING POLYMERS; SEMICONDUCTOR GROWTH; SUBSTRATES; X RAY SCATTERING;

CRYSTAL TRUNCATION ROD (CTR); LAUE FUNCTION; PERYLENETETRACARBOXYLIC DIANHYDRIDE; SELF-ASSEMBLED MONOLAYERS (SAM);

HETEROJUNCTIONS;

EID: 0033734360     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(99)01895-5     Document Type: Article

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