Direct observation of variations of optical properties in single quantum dots by using time-resolved near-field scanning optical microscope

Physica E: Low-Dimensional Systems and Nanostructures

Volumn 7, Issue 3, 2000, Pages 377-382

  Matsuda, K ^a   Matsumoto, T ^b   Saito, H ^c   Nishi, K ^c   Saiki, T ^a  

^a KANAGAWA ACADEMY OF SCIENCE AND TECHNOLOGY   (Japan)

^b TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^c NEC CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; OPTICAL MICROSCOPY; OPTICAL PROPERTIES; PHOTOLUMINESCENCE; PULSED LASER APPLICATIONS; QUANTUM EFFICIENCY; SCANNING; SEMICONDUCTING INDIUM GALLIUM ARSENIDE;

NEAR-FIELD SCANNING OPTICAL MICROSCOPY; SELF-ASSEMBLED STRUCTURES;

SEMICONDUCTOR QUANTUM DOTS;

EID: 0033726266     PISSN: 13869477     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1386-9477(99)00345-8     Document Type: Article

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