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Volumn 18, Issue 1, 2000, Pages 267-278
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Mechanistic feature-scale profile simulation of SiO2 low-pressure chemical vapor deposition by tetraethoxysilane pyrolysis
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Author keywords
[No Author keywords available]
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Indexed keywords
CHEMICAL VAPOR DEPOSITION;
COMPUTER SIMULATION;
PYROLYSIS;
REACTION KINETICS;
SILICA;
THIN FILMS;
SOFTWARE PACKAGE EVOLVE;
TETRAETHOXYSILANE;
SILANES;
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EID: 0033725631
PISSN: 10711023
EISSN: None
Source Type: Journal
DOI: 10.1116/1.591182 Document Type: Article |
Times cited : (16)
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References (19)
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