Structural properties and relaxation behavior of short-period BeTe/ZnSe superlattices

Journal of Crystal Growth

Volumn 214, Issue , 2000, Pages 330-334

  Gerthsen, D ^a   Walter, T ^a   Fischer, F ^b   Gerhard, T ^b   Waag, A ^b   Landwehr, G ^b  

^a UNIVERSITY OF KARLSRUHE   (Germany)

^b UNIVERSITY OF WÜRZBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL BONDS; COMPRESSIVE STRESS; CRACKS; CRYSTAL STRUCTURE; DISLOCATIONS (CRYSTALS); RELAXATION PROCESSES; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING TELLURIUM COMPOUNDS; SEMICONDUCTING ZINC COMPOUNDS; TENSILE STRESS; TRANSMISSION ELECTRON MICROSCOPY;

BERYLLIUM TELLURIDE; MISMATCH RELAXATION; NOMARSKI INTERFERENCE LIGHT MICROSCOPY; ZINC SELENIDE;

SEMICONDUCTOR SUPERLATTICES;

EID: 0033723882     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(00)00103-2     Document Type: Article

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