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Volumn 51, Issue , 2000, Pages 373-392

New compact physical submicron MOSFET model for circuit simulation

Author keywords

[No Author keywords available]

Indexed keywords

BENCHMARKING; CAPACITANCE; CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; ELECTRIC CHARGE; ELECTRIC CONDUCTANCE; ELECTRIC CURRENTS; MATHEMATICAL MODELS; TRANSCONDUCTANCE;

EID: 0033723292     PISSN: 01679317     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-9317(99)00509-2     Document Type: Article
Times cited : (3)

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    • February
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    • Tsividis, Y.1
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    • (1995) IEEE Trans. Electronic Devices , vol.42 , Issue.2 FEBRUARY , pp. 283-287
    • Iniguez, B.1    Moreno, E.G.2
  • 10
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    • Characterization of the electron mobility in the inverted 〈100〉 Si surface
    • A.G. Sabnis, J.T. Clemens, Characterization of the electron mobility in the inverted 〈100〉 Si surface, in IEDM Tech. Dig. (1979) 18-21.
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    • Sabnis, A.G.1    Clemens, J.T.2
  • 12
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    • Physical and CAD models for the implanted-channel VLSI MOSFET
    • Wright G.T. Physical and CAD models for the implanted-channel VLSI MOSFET. IEEE Trans. Electron Devices. ED-34:(4, April):1987;823-833.
    • (1987) IEEE Trans. Electron Devices , vol.34 , Issue.4 APRIL , pp. 823-833
    • Wright, G.T.1
  • 13
    • 84945713471 scopus 로고
    • Hot-electron induced MOSFET degradation-model, monitor, improvement
    • Hu C., Tam S., Hsu F.C., Ko P.K., Chan T.Y., Kyle K.W. Hot-electron induced MOSFET degradation-model, monitor, improvement. IEEE Trans. Electron Devices. 32:(February):1985;375-385.
    • (1985) IEEE Trans. Electron Devices , vol.32 , Issue.FEBRUARY , pp. 375-385
    • Hu, C.1    Tam, S.2    Hsu, F.C.3    Ko, P.K.4    Chan, T.Y.5    Kyle, K.W.6
  • 14
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    • PCIM: A physically based continuous short-channel IGFET model for circuit simulation
    • June
    • N.D. Arora, R. Rios, C. Huang, K. Raol, PCIM: a physically based continuous short-channel IGFET model for circuit simulation, IEEE Trans. Electron Devices 41(6) (June 1994) 988-997.
    • (1994) IEEE Trans. Electron , vol.41 , Issue.6 , pp. 988-997
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.