Pattern formation in PbTe multilayer films

Surface Science

Volumn 454, Issue 1, 2000, Pages 823-826

  Teichert, C ^a   Jamnig, B ^a   Oswald, J ^a  

^a UNIVERSITY OF LEOBEN   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; EPITAXIAL GROWTH; MORPHOLOGY; MULTILAYERS; SEMICONDUCTING LEAD COMPOUNDS; SURFACE ROUGHNESS;

LEAD TELLURIDE;

SEMICONDUCTING FILMS;

EID: 0033722718     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(00)00256-9     Document Type: Article

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