Silicon nanoparticles characterization by Auger electron spectroscopy

Surface Science

Volumn 454, Issue 1, 2000, Pages 952-956

  Vdovenkova, T ^a   Strikha, V ^a   Tsyganova, A ^a  

^a TARAS SHEVCHENKO NATIONAL UNIVERSITY OF KYIV   (Ukraine)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; CRYSTAL IMPURITIES; ELECTROCHEMISTRY; ETCHING; HYDROFLUORIC ACID; INTERFACES (MATERIALS); NANOSTRUCTURED MATERIALS; NICKEL; OXYGEN; PARTICLE SIZE ANALYSIS; SINGLE CRYSTALS; TITANIUM;

NANOPARTICLES;

POROUS SILICON;

EID: 0033722714     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(00)00138-2     Document Type: Article

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