Auger electron spectroscopy study of the electronic structure of porous silicon-metal interfaces

Journal of Electron Spectroscopy and Related Phenomena

Volumn 83, Issue 2-3, 1997, Pages 159-163

  Vdovenkova, T ^a   Strikha, V ^a   Vikulov, V ^a  

^a TARAS SHEVCHENKO NATIONAL UNIVERSITY OF KYIV   (Ukraine)

Author keywords

Auger electron spectroscopy; Electronic structure; Porous silicon metal interface

Indexed keywords

ARGON; CHEMICAL BONDS; ELECTRONIC STRUCTURE; ENERGY GAP; GOLD; INTERFACES (MATERIALS); IONS; POROUS SILICON; SPUTTERING; TITANIUM;

ELECTRON CONCENTRATION; ION SPUTTERING; POROUS SILICON METAL INTERFACES;

AUGER ELECTRON SPECTROSCOPY;

EID: 0031074586     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0368-2048(96)03067-8     Document Type: Article

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