Determination of the step height of the binary phase grating from its Fresnel images

Optik (Jena)

Volumn 111, Issue 5, 2000, Pages 207-210

  Jaroszewicz, Zbigniew ^a,d   Kolodziejczyk, Andrzej ^b,e   Kowalik, Andrzej ^c   Restrepo, Roberto ^a  

^a UNIVERSIDAD NACIONAL DE COLOMBIA   (Colombia)

^b UNIVERSIDAD DE ANTIOQUIA   (Colombia)

^c Department of Micro and Nanotechnology of Wide Bandgap Semiconductors   (Poland)

^d INSTITUTE OF APPLIED OPTICS   (Poland)

^e WARSAW UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTIVE OPTICS; IMAGING TECHNIQUES; INTEGRAL EQUATIONS; LIGHT TRANSMISSION; OPACITY; VISIBILITY;

BINARY INTENSITY PATTERN; BINARY PHASE GRATINGS; FRESNEL DIFFRACTION INTEGRAL; FRESNEL IMAGES; SELF IMAGING; STEP HEIGHT DETERMINATION;

DIFFRACTION GRATINGS;

EID: 0033722064     PISSN: 00304026     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (6)

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