Nanotips prepared by ion or cluster impacts for flat panel displays

Surface and Coatings Technology

Volumn 128-129, Issue 1, 2000, Pages 59-65

  Thevenard, Paul A ^a   Dupin, Jean Pierre ^a   Thien, Binh Vu ^a   Purcell, Stephen T ^a   Semet, Vincent ^a  

^a UNIVERSITÉ LYON 1   (France)

Author keywords

Electron emission; Fullerene; Irradiation; Rutile; Sapphire; Tracks

Indexed keywords

ALUMINA; AMORPHIZATION; ATOMIC FORCE MICROSCOPY; ELECTRON EMISSION; FLAT PANEL DISPLAYS; FULLERENES; HEAVY IONS; ION BEAMS; ION BOMBARDMENT; SAPPHIRE; TITANIUM DIOXIDE; TRANSMISSION ELECTRON MICROSCOPY;

NANOTIPS;

SURFACE TREATMENT;

EID: 0033721636     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0257-8972(00)00657-5     Document Type: Article

References (9)

1. E.C.H. Silk, R.S. Barnes, Philos. Mag. 4 (1959) 970.
2. R.L. Fleisher, P.B. Price, R.M. Walker, Nuclear Tracks in Solids, University of California Press, Berkeley, 1979.
3. M. Toulemonde, C. Dufour, E. Paumier, Phys. Rev. B 46 (1992) 14362.
4. B. Canut, S.M.M. Ramos, Rad. Eff. Def. Sol. 145 (1998) 1.
5. B. Vu Thien, J.P. Dupin, P. Thevenard, S.T. Purcell, V. Semet, Solid State Emitters (IVMC) Darmstadt, 6-9 July 1999.
6. J.F. Ziegler, J.P. Biersack, U. Littmark, Stopping Power and Ranges of Ions in Matter, Pergamon, New York, 1985.
7. S.M.M. Ramos, N. Bonardi, B. Canut, S. Bouffard, S. Della Negra, Nucl. Instrum. Methods Phys. Res. B 143 (1998) 319.
8. R.S. Averback, M. Gualy, Nucl. Instrum. Methods Phys. Res. B 90 (1994) 191.
9. B. Vu Thien, J.P. Dupin, P. Thevenard, Université LYON 1 patent pending, May 1999, No 9906254.