Finite-element analysis of semiconductor devices: The FIELDAY program

IBM Journal of Research and Development

Volumn 44, Issue 1-2, 2000, Pages 142-155

  Buturla, E M ^a   Cottrell, P E ^a   Grossman, B M ^a   Salsburg, K A ^a  

^a General Technology Division   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; BIPOLAR TRANSISTORS; COMPUTER SIMULATION; DIFFERENTIAL EQUATIONS; FIELD EFFECT TRANSISTORS; FINITE ELEMENT METHOD; LINEARIZATION; MATRIX ALGEBRA; SEMICONDUCTOR DEVICE MODELS;

MOBILE CARRIER TRANSPORT;

SEMICONDUCTOR DEVICE TESTING;

EID: 0033718703     PISSN: 00188646     EISSN: None     Source Type: Journal    
DOI: 10.1147/rd.441.0142     Document Type: Article

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