SEMICONDUCTOR ANALYSIS USING FINITE ELEMENTS - 2. IGFET AND BJT CASE STUDIES.

IBM Journal of Research and Development

Volumn 25, Issue 4, 1981, Pages 246-260

  Hachtel, G D ^a   Mack, M H ^a   O'Brien, R R ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

MATHEMATICAL MODELS;

SEMICONDUCTOR DEVICES;

EID: 0019595896     PISSN: 00188646     EISSN: None     Source Type: Journal    
DOI: 10.1147/rd.254.0246     Document Type: Article

References (31)