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Volumn 306, Issue 1-2, 2000, Pages 262-269
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Two types of checkerboard-like microstructures in Au-Cu-Pd ternary alloys
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Author keywords
[No Author keywords available]
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Indexed keywords
AGE HARDENING;
COMPOSITION;
CRYSTAL STRUCTURE;
ELECTRON DIFFRACTION;
HARDNESS TESTING;
METALLOGRAPHIC MICROSTRUCTURE;
PHASE TRANSITIONS;
TERNARY SYSTEMS;
TRANSMISSION ELECTRON MICROSCOPY;
CHECKERBOARD LIKE MICROSTRUCTURE;
FACE CENTERED CUBIC STRUCTURE;
GOLD COPPER PALLADIUM ALLOYS;
DENTAL ALLOYS;
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EID: 0033716757
PISSN: 09258388
EISSN: None
Source Type: Journal
DOI: 10.1016/S0925-8388(00)00791-X Document Type: Article |
Times cited : (14)
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References (22)
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