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Volumn 306, Issue 1-2, 2000, Pages 262-269

Two types of checkerboard-like microstructures in Au-Cu-Pd ternary alloys

Author keywords

[No Author keywords available]

Indexed keywords

AGE HARDENING; COMPOSITION; CRYSTAL STRUCTURE; ELECTRON DIFFRACTION; HARDNESS TESTING; METALLOGRAPHIC MICROSTRUCTURE; PHASE TRANSITIONS; TERNARY SYSTEMS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0033716757     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-8388(00)00791-X     Document Type: Article
Times cited : (14)

References (22)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.