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Volumn 370, Issue 1, 2000, Pages 311-314
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Propagation loss and birefringence properties around 1.55 μm of polymeric optical waveguides fabricated with cross-linked silicone
a
NTT CORPORATION
(Japan)
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Author keywords
[No Author keywords available]
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Indexed keywords
BIREFRINGENCE;
COPOLYMERIZATION;
CROSSLINKING;
ELLIPSOMETRY;
LIGHT PROPAGATION;
MONOMERS;
NUCLEAR MAGNETIC RESONANCE SPECTROSCOPY;
OPTICAL WAVEGUIDES;
PHOTOLITHOGRAPHY;
REACTIVE ION ETCHING;
SILICONES;
STRUCTURE (COMPOSITION);
CUTBACK METHOD;
POLYMERIC OPTICAL WAVEGUIDE;
PROPAGATION LOSS;
SENALMONT ELLIPSOMETRY;
SINGLE MODE OPTICAL WAVEGUIDE;
THIN FILMS;
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EID: 0033716384
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/S0040-6090(00)00921-4 Document Type: Article |
Times cited : (30)
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References (14)
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