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Volumn 338, Issue , 2000, Pages

Multi-wafer VPE growth and characterization of SiC epitaxial layers

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL REACTORS; SEMICONDUCTING FILMS; SEMICONDUCTOR DOPING; SILICON WAFERS; SUBSTRATES; VAPOR PHASE EPITAXY;

EID: 0033715399     PISSN: 02555476     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article
Times cited : (3)

References (9)
  • 4
    • 12944292255 scopus 로고    scopus 로고
    • Aixtron Inc. Kackerstr. 15-17, D-52072 Aachen, Germany
    • Aixtron Inc. Kackerstr. 15-17, D-52072 Aachen, Germany.
  • 7
    • 0344356036 scopus 로고    scopus 로고
    • Silicon Carbide, III-Nitrides, and Related Materials, Switzerland
    • A. A. Burk, Jr., M. J. O'Loughlin, and S. S. Mani, in Silicon Carbide, III-Nitrides, and Related Materials, Materials Science Forum, 264-268, (Switzerland 1998), p. 83-88.
    • (1998) Materials Science Forum , vol.264-268 , pp. 83-88
    • Burk Jr., A.A.1    O'Loughlin, M.J.2    Mani, S.S.3
  • 9
    • 0031675630 scopus 로고    scopus 로고
    • Silicon Carbide, III-Nitrides, and Related Materials, Switzerland
    • M. F. MacMillan, P. O. Narfgren, A. Henry, and E. Janzen, in Silicon Carbide, III-Nitrides, and Related Materials, Materials Science Forum, 264-268, (Switzerland 1998), p. 645-648
    • (1998) Materials Science Forum , vol.264-268 , pp. 645-648
    • MacMillan, M.F.1    Narfgren, P.O.2    Henry, A.3    Janzen, E.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.