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Volumn 18, Issue 1, 2000, Pages 545-548

Effective channel length and base width measurements by scanning capacitance microscopy

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE MEASUREMENT; HETEROJUNCTION BIPOLAR TRANSISTORS; MICROSCOPIC EXAMINATION; MOS DEVICES;

EID: 0033712826     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.591229     Document Type: Article
Times cited : (14)

References (3)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.