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Volumn , Issue , 2000, Pages 209-212

Advanced compact model for short-channel MOS transistors

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CARRIER CONCENTRATION; COMPUTER SIMULATION; ELECTRIC CHARGE; ELECTRIC VARIABLES MEASUREMENT; INTEGRATED CIRCUIT LAYOUT; NUMERICAL METHODS; SEMICONDUCTOR DEVICE MODELS;

EID: 0033711827     PISSN: 08865930     EISSN: None     Source Type: Journal    
DOI: 10.1109/CICC.2000.852650     Document Type: Article
Times cited : (16)

References (9)
  • 2
    • 85177144202 scopus 로고
    • California Institute of Technology Ca, Pasadena
    • M. A. Maher A charge-controlled model for MOS transistors 1989 California Institute of Technology Ca, Pasadena
    • (1989)
    • Maher, M.A.1
  • 3
    • 0003905889 scopus 로고
    • Semiconductor device modeling for VLSI
    • Prentice Hall Englewoods Cliffs
    • K. Lee M. Shur T. A. Fjeldly T. Ytterdal Semiconductor device modeling for VLSI 1993 Prentice Hall Englewoods Cliffs
    • (1993)
    • Lee, K.1    Shur, M.2    Fjeldly, T.A.3    Ytterdal, T.4
  • 4
    • 0029342165 scopus 로고
    • An analytical MOS transistor model valid in all regions of operation and dedicated to low-voltage and low-current applications
    • C. Enz F. Krummenacher E. A. Vittoz An analytical MOS transistor model valid in all regions of operation and dedicated to low-voltage and low-current applications Analog Integrated Circuits and Signal Processing Journal 8 83 114 July 1995
    • (1995) Analog Integrated Circuits and Signal Processing Journal , vol.8 , pp. 83-114
    • Enz, C.1    Krummenacher, F.2    Vittoz, E.A.3
  • 5
    • 0003750001 scopus 로고    scopus 로고
    • Operation and modeling of the MOS transistor
    • 2nd McGraw-Hill New York
    • Y. Tsividis Operation and modeling of the MOS transistor 2nd 1999 McGraw-Hill New York
    • (1999)
    • Tsividis, Y.1
  • 7
    • 0028386555 scopus 로고
    • MOSFET modeling for analog circuit CAD: problems and prospects
    • Y. P. Tsividis K. Suyama MOSFET modeling for analog circuit CAD: problems and prospects IEEE Journal of Solid-State Circuits 29 3 210 216 March 1994
    • (1994) IEEE Journal of Solid-State Circuits , vol.29 , Issue.3 , pp. 210-216
    • Tsividis, Y.P.1    Suyama, K.2
  • 8
    • 85177108500 scopus 로고    scopus 로고
    • Test Procedures for Micro-electronic MOSFET Circuit Simulator Model Validation 1997 IEEE Recommended Practices #P1485 WWW: http://ray.eeel.nist.gov/modval
    • (1997)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.