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Volumn , Issue , 2000, Pages 209-212
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Advanced compact model for short-channel MOS transistors
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Author keywords
[No Author keywords available]
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Indexed keywords
CAPACITANCE;
CARRIER CONCENTRATION;
COMPUTER SIMULATION;
ELECTRIC CHARGE;
ELECTRIC VARIABLES MEASUREMENT;
INTEGRATED CIRCUIT LAYOUT;
NUMERICAL METHODS;
SEMICONDUCTOR DEVICE MODELS;
ADVANCED COMPACT MODEL;
CARRIER VELOCITY SATURATION;
CIRCUIT SIMULATION;
INVERSION CHARGE DENSITY;
SHORT CHANNEL EFFECTS;
SOURCE DRAIN SYMMETRY;
UNIFIED CHARGE CONTROL MODEL;
MOSFET DEVICES;
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EID: 0033711827
PISSN: 08865930
EISSN: None
Source Type: Journal
DOI: 10.1109/CICC.2000.852650 Document Type: Article |
Times cited : (16)
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References (9)
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