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Volumn 18, Issue 1, 2000, Pages 37-41

Biased target deposition

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; ELECTRIC CONDUCTIVITY MEASUREMENT; ELECTRON EMISSION; ELECTRON SOURCES; FILM PREPARATION; ION BEAMS; ION SOURCES; SPUTTERING; THICKNESS MEASUREMENT; THIN FILMS;

EID: 0033708050     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.582155     Document Type: Article
Times cited : (49)

References (2)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.