Study on the degradation mechanism of Organic Light-emitting Diodes (OLEDS)

Synthetic Metals

Volumn 91, Issue 1-3, 1997, Pages 191-193

  Zou, Dechun ^a   Yahiro, Masayuki ^b   Tsutsui, Tetsuo ^b  

^a JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^b KYUSHU UNIVERSITY   (Japan)

Author keywords

Carrier injection; Degradation; Dipoles; Electric field induced enhancement; Electric field induced recovery; Internal electric field; Light emitting diodes; Spontaneous recovery

Indexed keywords

CHARGE CARRIERS; ELECTRIC FIELD EFFECTS; SEMICONDUCTING ORGANIC COMPOUNDS; SEMICONDUCTOR DEVICE MODELS;

ELECTRIC FIELD INDUCED ENHANCEMENT; ELECTRIC FIELD INDUCED RECOVERY;

LIGHT EMITTING DIODES;

EID: 0031351704     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0379-6779(97)04012-5     Document Type: Article

References (1)

1. Y. Hamada, C. Adachi, T. Tsutsui and S. Saito, Jpn. J. Appl. Phys., 31 (1992) 1812-1816.