Non contact broadband microwave material characterization at low and high temperatures

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4129, Issue , 2000, Pages 324-331

  Jose, K A ^a   Varadan, Vasundara V ^a   Hollinger, Richard D ^b   Tellakula, Anikumar R ^b   Varadan, Vijay K ^a  

^a The Pennsylvania State University   (United States)

^b HVS Technologies Inc   (United States)

Author keywords

Free space method; Material characterization; Non destructive testing

Indexed keywords

DIELECTRIC CHARACTERIZATION; FREE SPACE METHODS; FREQUENCY DEPENDENCE; MATERIAL CHARACTERIZATIONS; NARROW FREQUENCY BAND; NON DESTRUCTIVE TESTING; VERY LOW TEMPERATURES; WIDE FREQUENCY BANDS;

DIELECTRIC PROPERTIES; FREQUENCY BANDS; NONDESTRUCTIVE EXAMINATION; PROCESS MONITORING; FREQUENCIES; HIGH TEMPERATURE PROPERTIES; HORN ANTENNAS; LOW TEMPERATURE PROPERTIES; MICROWAVES; PERMITTIVITY; TEMPERATURE;

CHARACTERIZATION; DIELECTRIC MATERIALS;

DIELECTRIC CHARACTERIZATION; FREE SPACE METHOD; MATERIAL CHARACTERIZATION; SINGLE SWEEP NETWORK ANALYZER;

EID: 0033700209     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.390629     Document Type: Conference Paper

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