In situ microwave characterization of nonplanar dielectric objects

IEEE Transactions on Microwave Theory and Techniques

Volumn 48, Issue 3, 2000, Pages 388-394

  Varadan, Vasundara V ^a   Jose, K A ^a   Varadan, Vijay K ^a  

^a The Center for Nanotechnology Education and Utilization   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FREE-SPACE MEASUREMENT SYSTEMS; MICROWAVE NONDESTRUCTIVE TESTING; NONPLANAR DIELECTRIC OBJECTS;

CYLINDERS (SHAPES); GLASS; MICROWAVE DEVICES; NONDESTRUCTIVE EXAMINATION; PERMITTIVITY MEASUREMENT;

DIELECTRIC DEVICES;

EID: 0033907412     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/22.826837     Document Type: Article

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