Global finite difference time domain analysis of a silicon nonlinear transmission line

IEEE MTT-S International Microwave Symposium Digest

Volumn 1, Issue , 2000, Pages 371-374

  Thiel, Werner ^a   Birk, Martin ^a   Menzel, Wolfgang ^a   Abele, Peter ^a  

^a UNIVERSITY OF ULM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DRIFT DIFFUSION MODEL; SILICON NONLINEAR TRANSMISSION LINE; TRANSMISSION LINE LOSS;

COMPUTER SIMULATION; ELECTRIC IMPEDANCE; EQUIVALENT CIRCUITS; FINITE DIFFERENCE METHOD; LUMPED PARAMETER NETWORKS; NONLINEAR NETWORKS; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICE MODELS; TIME DOMAIN ANALYSIS; TRANSMISSION LINE THEORY; VARACTORS;

MICROWAVE CIRCUITS;

EID: 0033694256     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (10)

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