Evaluation of Zn uniformity in CdZnTe substrates

Journal of Electronic Materials

Volumn 29, Issue 6, 2000, Pages 654-656

  Hirano, R ^a   Hichiwa, A ^a   Maeda, H ^a   Yamamoto, T ^a  

^a JAPAN ENERGY CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE MATERIALS; INFRARED SPECTROSCOPY; SEMICONDUCTOR DIODES; SPECTROMETERS; TEMPERATURE DISTRIBUTION; ZINC;

CADMIUM ZINC TELLURIDE; DIODE ARRAY SPECTROMETERS;

SEMICONDUCTING CADMIUM TELLURIDE;

EID: 0033688588     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-000-0200-7     Document Type: Article

References (3)

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2. S.M. Johnson, S. Sen, and W.H. Konkel, J. Vac. Sci. Technol. B9, 1897 (1991).
3. P. Capper, J.E. Harris, E.S. O'keefe, and C.L. Jones, Adv. Mater. for Optics and Electron. 5, 101 (1995).