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Volumn 214, Issue , 2000, Pages 225-228

Study on photoluminescence of interface layer of ZnTe/CdTe heterostructure

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; AUGER ELECTRON SPECTROSCOPY; DEPOSITION; ETCHING; INTERFACES (MATERIALS); LIGHT EMISSION; OPTICAL PROPERTIES; PHOTOLUMINESCENCE; POLYCRYSTALS; SEMICONDUCTING CADMIUM TELLURIDE; SEMICONDUCTING ZINC COMPOUNDS; X RAY DIFFRACTION ANALYSIS;

EID: 0033686938     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(00)00090-7     Document Type: Article
Times cited : (4)

References (9)
  • 1
    • 0342778726 scopus 로고
    • Siffert P. SPIE. 98:1995;2305.
    • (1995) SPIE , vol.98 , pp. 2305
    • Siffert, P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.