XPS study of the influence of impurity Cu on the electronic structure of SrS

Surface Science

Volumn 454, Issue 1, 2000, Pages 529-533

  Vdovenkova, T ^a   Vdovenkov, A ^b   Soininen, E ^c  

^a TARAS SHEVCHENKO NATIONAL UNIVERSITY OF KYIV   (Ukraine)

^b Research Institute for Microdevices   (Ukraine)

^c Planar Systems Inc Finland   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; COPPER; CRYSTAL IMPURITIES; CRYSTAL LATTICES; ELECTRONIC STRUCTURE; SECONDARY ION MASS SPECTROMETRY; SEMICONDUCTING FILMS; SEMICONDUCTOR DOPING; SULFUR; X RAY CRYSTALLOGRAPHY;

STRONTIUM SULFIDE;

STRONTIUM COMPOUNDS;

EID: 0033686858     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(00)00226-0     Document Type: Article

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