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Volumn 23, Issue 2, 2000, Pages 233-238

Wafer-level chip size package (WL-CSP)

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION; DIELECTRIC MATERIALS; ELECTRONICS PACKAGING; INTEGRATED CIRCUIT LAYOUT; PASSIVATION; POLYMERS; PRINTED CIRCUIT BOARDS; SILICON WAFERS; SOLDERING ALLOYS; SURFACE MOUNT TECHNOLOGY; THIN FILMS;

EID: 0033686294     PISSN: 15213323     EISSN: None     Source Type: Journal    
DOI: 10.1109/6040.846640     Document Type: Article
Times cited : (31)

References (13)
  • 1
    • 33749893207 scopus 로고    scopus 로고
    • "High density, low cost packaging and interconnect technology,"
    • Omiya, Tokyo, Japan, Apr.
    • P. Garrou, "High density, low cost packaging and interconnect technology," in proc. 2nd IEMT/IMC Symp., Omiya, Tokyo, Japan, Apr. 1998.
    • (1998) Proc. 2nd IEMT/IMC Symp.
    • Garrou, P.1
  • 4
    • 0029705664 scopus 로고    scopus 로고
    • "Molded chip scale package for high pin count,"
    • S. Baba et al, "Molded chip scale package for high pin count," in proc. 46thECTC,pp. 1251-1257.
    • Proc. 46thECTC , pp. 1251-1257
    • Baba, S.1
  • 5
    • 84865945562 scopus 로고
    • "On-Chip Umverdrahtung-eine Möglichkeit zur Anpassung von Chip- Und Leiterplattenraster,"
    • Mär.
    • G. Chmiel, M. Topper, J. Simon, R. Wagner, and H. Reichl, "On-Chip Umverdrahtung-eine Möglichkeit zur Anpassung von Chip- und Leiterplattenraster," in Proc. SMT/ES&S/Hybrid, Mär. 1995.
    • (1995) Proc. SMT/ES&S/Hybrid
    • Chmiel, G.1    Topper, M.2    Simon, J.3    Wagner, R.4    Reichl, H.5
  • 6
    • 0029462477 scopus 로고
    • "A comparison of flip chip technology with chip size packages,"
    • San Diego, CA
    • J. Simon, M. Töpper, G. Chmiel, and H. Reichl, "A comparison of flip chip technology with chip size packages," in Proc. IEPS'95, San Diego, CA, 1995.
    • (1995) Proc. IEPS'95
    • Simon, J.1    Töpper, M.2    Chmiel, G.3    Reichl, H.4
  • 7
    • 33749897110 scopus 로고    scopus 로고
    • "Redistribution technology for chip scale package using photosensitive BCB,"
    • Feb. 2
    • M. Topper, J. Simon, and H. Reichl, "Redistribution technology for chip scale package using photosensitive BCB," in Future Conf., Feb. 2, 1997.
    • (1997) Future Conf.
    • Topper, M.1    Simon, J.2    Reichl, H.3
  • 8
    • 0029462477 scopus 로고
    • "A comparison of flip chip technology with chip size packages,"
    • San Diego, CA
    • J. Simon, M. Topper, G. Chmiel, and H. Reichl, "A comparison of flip chip technology with chip size packages," in Proc. IEPS'95, San Diego, CA, 1995.
    • (1995) Proc. IEPS'95
    • Simon, J.1    Topper, M.2    Chmiel, G.3    Reichl, H.4
  • 13
    • 33749905988 scopus 로고    scopus 로고
    • presented at the SMT, Nürnberg, Germany
    • A. Heime, "CSP tutorial," presented at the SMT, Nürnberg, Germany, 1998.
    • (1998) "CSP Tutorial,"
    • Heime, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.