Spectroscopic fingerprints of a surface Mott-Hubbard insulator: The case of SiC(0001)

Surface Science

Volumn 454, Issue 1, 2000, Pages 534-538

  Santoro, G ^a,b   Scandolo, S ^a,b   Tosatti, E ^a,b,c  

^a SISSA   (Italy)

^b INFM   (Italy)

^c ABDUS SALAM INTERNATIONAL CENTRE FOR THEORETICAL PHYSICS   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; AUGER ELECTRON SPECTROSCOPY; CHEMICAL BONDS; ELECTRIC INSULATING MATERIALS; ELECTRONIC STRUCTURE; MATHEMATICAL MODELS; PHOTOELECTRON SPECTROSCOPY; SEMICONDUCTING SILICON COMPOUNDS; SURFACE PHENOMENA;

MOTT-HUBBARD INSULATOR; SPECTROSCOPIC FINGERPRINTS;

SILICON CARBIDE;

EID: 0033683474     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(00)00236-3     Document Type: Article

References (13)

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