Analysis of electron standing waves in a vacuum gap of scanning tunneling microscopy: Measurement of band bending through energy shifts of electron standing wave

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 18, Issue 1, 2000, Pages 48-54

  Suganuma, Y ^a   Tomitori, M ^a  

^a JAPAN ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; ELECTRIC FIELDS; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING SILICON; VACUUM;

BAND BENDING EFFECT; DIFFERENTIAL CONDUCTANCE SPECTRA; ELECTRON STANDING WAVES;

ELECTRON BEAMS;

EID: 0033683043     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.591149     Document Type: Article

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