Origin of leakage current of YMnO3 thin films prepared by the sol-gel method

Materials Research Society Symposium - Proceedings

Volumn 596, Issue , 2000, Pages 481-486

  Kitahata, Hiroya ^a   Tadanaga, Kiyoharu ^a   Minami, Tsutomu ^a   Fujimura, Norifumi ^a   Ito, Taichiro ^a  

^a Osaka Prefecture University   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL MICROSTRUCTURE; DOPING (ADDITIVES); FILM PREPARATION; HYDROGEN; LEAKAGE CURRENTS; NUCLEATION; RAPID THERMAL ANNEALING; X RAY DIFFRACTION ANALYSIS; YTTRIUM COMPOUNDS; ZIRCONIUM;

DENSE MICROSTRUCTURE; VALENCE FLUCTUATION; YTTRIUM ALKOXIDE;

THIN FILMS;

EID: 0033680186     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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