Deposition and characterization of low-loss epitaxial non-linear dielectric thin films for microwave devices

Integrated Ferroelectrics

Volumn 28, Issue 1-4, 2000, Pages 161-173

  Hermann, Allen M ^a   Veeraraghavan, Badri ^a   Balzar, Davor ^a,b   Fickett, Fred R ^b  

^a UNIVERSITY OF COLORADO   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

BSTO; Bulk; Epitaxial thin film; KTO; Tunable capacitor

Indexed keywords

ATOMIC FORCE MICROSCOPY; BARIUM COMPOUNDS; CRYSTAL STRUCTURE; DIELECTRIC PROPERTIES OF SOLIDS; ELECTRIC FIELD EFFECTS; MICROWAVE DEVICES; MORPHOLOGY; PERMITTIVITY; PEROVSKITE; POTASSIUM COMPOUNDS; PULSED LASER APPLICATIONS; X RAY DIFFRACTION ANALYSIS;

INTERDIGITATED CAPACITORS; LOSS TANGENTS; LOW LOSS EPITAXIAL NONLINEAR DIELECTRIC THIN FILMS; THIN FILM CAPACITORS;

THIN FILM DEVICES;

EID: 0033658297     PISSN: 10584587     EISSN: None     Source Type: Journal    
DOI: 10.1080/10584580008222229     Document Type: Article

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