Short range structural disorder in lanthanum doped lead titanate thin films

Integrated Ferroelectrics

Volumn 29, Issue 1-2, 2000, Pages 21-31

  Dobal, P S ^a   Bhaskar, S ^a   Majumder, S B ^a   Katiyar, R S ^a  

^a UNIVERSITY OF PUERTO RICO   (Puerto Rico)

Author keywords

PLT; Raman scattering; Sol gel

Indexed keywords

ATOMIC FORCE MICROSCOPY; DOPING (ADDITIVES); LANTHANUM; LEAD COMPOUNDS; MORPHOLOGY; PHASE TRANSITIONS; RAMAN SCATTERING; SAPPHIRE; SUBSTITUTION REACTIONS; SURFACE ROUGHNESS; SURFACES; X RAY DIFFRACTION ANALYSIS;

LEAD TITANATE; PARAELECTRIC CUBIC PHASE; SHORT RANGE STRUCTURAL DISORDER;

THIN FILMS;

EID: 0033646070     PISSN: 10584587     EISSN: None     Source Type: Journal    
DOI: 10.1080/10584580008216671     Document Type: Article

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