High resolution K capture X-ray fluorescence spectroscopy: A new tool for chemical characterization [18]

Journal of the American Chemical Society

Volumn 121, Issue 20, 1999, Pages 4926-4927

  Bergmann, U ^a   Glatzel, P ^b   DeGroot, F ^c   Cramer, S P ^a,b  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c UTRECHT UNIVERSITY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL ANALYSIS; CHEMICAL REACTION KINETICS; DIAGNOSTIC IMAGING; DIAGNOSTIC VALUE; ELECTRON CAPTURE DETECTION; LETTER; MASS SPECTROMETRY; MATHEMATICAL COMPUTING; X RAY FLUORESCENCE;

EID: 0033606265     PISSN: 00027863     EISSN: None     Source Type: Journal    
DOI: 10.1021/ja984454w     Document Type: Letter

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