On the nature of the electric-field effect on YBa2Cu3O7-δ grain boundary junctions employing epitaxial SrTiO3 gate insulators

Applied Physics Letters

Volumn 74, Issue 7, 1999, Pages 1027-1029

  Windt, M ^a   Haensel, H ^a   Koelle, D ^a   Gross, R ^a  

^a UNIVERSITY OF COLOGNE   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; CRITICAL CURRENTS; ELECTRIC BREAKDOWN; ELECTRIC CURRENT MEASUREMENT; ELECTRIC FIELD EFFECTS; ELECTRIC INSULATORS; GATES (TRANSISTOR); JUNCTION GATE FIELD EFFECT TRANSISTORS; PERMITTIVITY; STRONTIUM COMPOUNDS; SUPERCONDUCTING FILMS; YTTRIUM BARIUM COPPER OXIDES;

EPITAXIAL FILM; GRAIN BOUNDARY JUNCTIONS; STRONTIUM TITANATE;

JOSEPHSON JUNCTION DEVICES;

EID: 0033556897     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.123444     Document Type: Article

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