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41
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0344932944
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note
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-3[15]
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42
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0344502043
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note
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3.
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43
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0344932943
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note
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3,
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44
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0344932942
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note
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-3[15]
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45
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0345364355
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note
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3,
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46
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0345364354
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note
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f) Crystallographic data (excluding structure factors) for the structures of 1 and 3 reported in this paper have been deposited with the Cambridge Crystallographic Data Centre as supplementary publication no. CCDC-115529 and -115530. Copies of the data can be obtained free of charge on application to CCDC, 12 Union Road, Cambridge CB21EZ, UK (fax: (+44)1223-336-033; e-mail: deposit@ccdc.cam.ac.uk).
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48
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0004150157
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Siemens Analytical X-ray Instruments, Madison, WI
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b) G. M. Sheldrick, SHELXTL, Version 5.03, Siemens Analytical X-ray Instruments, Madison, WI, 1995;
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(1995)
SHELXTL, Version 5.03
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Sheldrick, G.M.1
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50
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0344502042
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note
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+, n = 12): V-O 1.932-2.022, V=O 1.590, P-O 1.496-1.569, B-O 1.461-1.480; O-P-O 107.5-112.0, O-B-O 105.1-111.0.
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