Corrugated quantum well infrared photodetectors for polarization detection

Applied Physics Letters

Volumn 74, Issue 6, 1999, Pages 862-864

  Chen, C J ^a   Choi, K K ^a,b   Rokhinson, L ^a   Chang, W H ^a,b   Tsui, D C ^a  

^a Princeton University   (United States)

^b U S ARMY RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; DIFFRACTION GRATINGS; LIGHT POLARIZATION; PHOTOCURRENTS; POLARIMETERS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR QUANTUM WELLS;

OPTICAL COUPLER; POLARIZATION DETECTION;

INFRARED DETECTORS;

EID: 0033534857     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.123391     Document Type: Article

References (5)

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