Corrugated quantum well infrared photodetectors for normal incident light coupling

Applied Physics Letters

Volumn 68, Issue 11, 1996, Pages 1446-1448

  Chen, C J ^a   Choi, K K ^a   Tidrow, M Z ^a   Tsui, D C ^a  

^a Princeton University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT DENSITY; CURRENT VOLTAGE CHARACTERISTICS; ETCHING; LIGHT ABSORPTION; LIGHT POLARIZATION; LIGHT REFLECTION; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR QUANTUM WELLS; WIRE;

ALUMINUM GALLIUM ARSENIDE; NORMAL INCIDENCE LIGHT COUPLING; PLANARIZATION; QUANTUM WELL INFRARED PHOTODETECTORS; RESPONSIVITY ENHANCEMENT; SINGLE COLOR DETECTORS; TOTAL INTERNAL REFLECTION; V GROOVE ETCHING;

INFRARED DETECTORS;

EID: 0030103977     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.116249     Document Type: Article

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