Refracted X-rays propagating near the surface under grazing incidence condition

Spectrochimica acta, Part B: Atomic spectroscopy

Volumn 54, Issue 1, 1999, Pages 227-230

  Hayashi, Kouichi ^a   Kawai, Jun ^a   Moriyama, Yoshihiko ^a   Horiuchi, Toshihisa ^a   Matsushige, Kazumi ^a  

^a KYOTO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

RADIATION DETECTORS; SILICON WAFERS; SOLID STATE DEVICES; THIN FILMS;

SNELL'S LAW; X RAY REFRACTION;

ELECTROMAGNETIC WAVE REFRACTION;

EID: 0033521423     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0584-8547(98)00192-X     Document Type: Article

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